• DocumentCode
    440081
  • Title

    Barrier coatings for CIGSS and CdTe cells

  • Author

    Olsen, Larry C. ; Kundu, Sambhu N. ; Bonham, Chartes C. ; Gross, Mark

  • Author_Institution
    Pacific Northwest Lab., Richland, WA, USA
  • fYear
    2005
  • fDate
    3-7 Jan. 2005
  • Firstpage
    327
  • Lastpage
    330
  • Abstract
    Barrier coatings for CIGSS and CdTe thin film solar cells will be critical for achieving reliable and long lived devices. Coatings based on a multilayer polymer/oxide approach developed at PNNL are being investigated as effective encapsulation of thin film solar cells. CIGSS circuits provided by Shell Solar Industries (SSI) and CdTe cells fabricated by the W. S. Sampath and coworkers at Colorado State University (CSU) are being utilized for the study. Barrier coatings involve deposition of a relatively thick polymer layer to establish a smooth surface for subsequent deposition of an oxide layer. Deposition of the first polymer/oxide dyad is followed by one or more additional pairs of polymer/oxide dyads. Very positive results have been obtained for encapsulated CIGSS circuits and CdTe cells subjected to 60°C and 90% relative humidity.
  • Keywords
    II-VI semiconductors; cadmium compounds; coating techniques; copper compounds; encapsulation; gallium compounds; indium compounds; multilayers; polymer films; semiconductor thin films; solar cells; surface structure; ternary semiconductors; 60 degC; CIGSS circuits; CIGSS thin film solar cells; CdTe; CdTe thin film solar cells; Colorado State University; Cu(InGa)(SeS)2; Shell Solar Industries; barrier coatings; device reliability; encapsulated CIGSS circuits; multilayer polymer/oxide approach; oxide layer deposition; polymer layer deposition; smooth surface; Coatings; Encapsulation; Nonhomogeneous media; Photovoltaic cells; Polymer films; Rough surfaces; Substrates; Surface roughness; Surface topography; Thin film circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-8707-4
  • Type

    conf

  • DOI
    10.1109/PVSC.2005.1488135
  • Filename
    1488135