Title :
Physical modes of thin-film PV degradation
Author :
Karpov, V.G. ; Shvydka, Diana ; Roussillon, Yann
Author_Institution :
Dept. of Phys. & Astron., Toledo Univ., OH, USA
Abstract :
We discuss physical modes of degradation related to the small thickness and lack of crystallinity in thin-film PV. We discriminate between 1) uniform material degradation through defect generation, light-induced diffusion, and electro-migration; 2) nonuniform degradation through ohmic or non-ohmic shunts; 3) metal contact deterioration. The first can equally apply to bulk and thin-film PV. Two others are specific to thin-film PV.
Keywords :
crystal defects; electromigration; ohmic contacts; photovoltaic effects; radiation effects; semiconductor thin films; crystallinity; defect generation; electro-migration; light-induced diffusion; metal contact deterioration; nonohmic shunts; nonuniform degradation; ohmic shunts; physical degradation modes; thin-film PV degradation; uniform material degradation; Astronomy; Capacitors; Crystalline materials; Crystallization; Degradation; Electric potential; Physics; Thermal resistance; Thin film circuits; Transistors;
Conference_Titel :
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
Print_ISBN :
0-7803-8707-4
DOI :
10.1109/PVSC.2005.1488163
