Title :
Embedded Non Volatile Memories In Deep-Submicron CMOS
Author :
Baldi, L. ; Maurelli, A.
Author_Institution :
STMicroelectronics, Agrate Brianza, Italy
Keywords :
EPROM; Electrons; History; Logic; Microcontrollers; Nonvolatile memory; Random access memory; Research and development; Testing; Tunneling;
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
