Title :
Non-Invasive Optical Characterisation Technique for Fast Switching CMOS Circuits
Author :
Stellari, F. ; Zappa, F. ; Ghioni, M. ; Cova, S.
Author_Institution :
Politecnico di Milano, Italy
Keywords :
Bandwidth; Circuit testing; Crosstalk; Detectors; Electron beams; High speed optical techniques; MOSFETs; Optical buffering; Optical sensors; Switching circuits;
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
