Title :
Implications of pocket optimisation on analog performance in deep sub-micron CMOS
Author :
Roes, R.F.M. ; van Brandenburg, A.C.M.C. ; Montree, A.H. ; Woerlee, P.H.
Author_Institution :
Philips Research Laboratories, Eindhoven, The Netherlands
Keywords :
CMOS process; CMOS technology; Degradation; Energy consumption; Implants; Leakage current; MOS devices; MOSFETs; Performance gain; Threshold voltage;
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
