Title :
Excess Noise in Sub-micron Silicon FET: Characterization, Prediction and Control
Author :
Franca-Neto, Luiz M. ; Harris, James S.
Author_Institution :
Stanford University, Stanford, CA, USA
Keywords :
Conducting materials; Electric resistance; FETs; Noise generators; Noise level; Noise measurement; Resistance heating; Resistors; Semiconductor device noise; Silicon;
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
