DocumentCode
440240
Title
Hybrid Integration of Spin-Valves and MESFETS: Technology Test for Future MRAM
Author
Das, J. ; Boeve, H. ; De Boeck, J. ; Borghs, G.
Author_Institution
IMEC, Leuven, Belgium
Volume
1
fYear
1999
fDate
13-15 Sept. 1999
Firstpage
272
Lastpage
275
Keywords
Giant magnetoresistance; III-V semiconductor materials; MESFETs; Magnetic fields; Magnetic multilayers; Random access memory; Semiconductor diodes; Testing; Transistors; Valves;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location
Leuven, Belgium
Print_ISBN
2-86332-245-1
Type
conf
Filename
1505492
Link To Document