DocumentCode :
440249
Title :
Low frequency noise characterisation of submicron vertical heterojuncton pMOSFETs
Author :
Collaert, N. ; Verheyen, P. ; De Meyer, K.
Author_Institution :
IMEC, Leuven, Belgium
Volume :
1
fYear :
1999
fDate :
13-15 Sept. 1999
Firstpage :
308
Lastpage :
311
Keywords :
Electrical resistance measurement; Fluctuations; Frequency; Germanium silicon alloys; Heterojunctions; Low-frequency noise; MOSFETs; Noise generators; Noise measurement; Silicon germanium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
Type :
conf
Filename :
1505501
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=440249
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