Title :
Low Temperature Generation of Stress Induced Leakage Current. Degradation Mechanism: E or 1/E Model?
Author :
Riess, P. ; Ghibaudo, G. ; Pananakakis, G.
Author_Institution :
LPCS / ENSERG, Grenoble, France
Keywords :
Carbon capture and storage; Degradation; Density measurement; Electric breakdown; Leakage current; Stress measurement; Temperature dependence; Temperature measurement; Temperature sensors; Time measurement;
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
