DocumentCode

440263

Title

Time stability of Stress Induced Leakage Current in thin gate oxides

Author

Cester, A. ; Paccagnella, A. ; Buso, M. ; Ghidini, G.

Author_Institution

Universita di Padova, Italy

Volume

1

fYear

1999

fDate

13-15 Sept. 1999

Firstpage

368

Lastpage

371

Keywords

Carbon capture and storage; Current density; Current measurement; Electrons; Leakage current; Stability; Steady-state; Stress measurement; Temperature; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 1999. Proceeding of the 29th European

Conference_Location

Leuven, Belgium

Print_ISBN

2-86332-245-1

Type

conf

Filename

1505516