DocumentCode :
440279
Title :
A General Model for MOS Transistor Matching
Author :
Croon, J.A. ; Rosmeulen, M. ; Van Huylenbroeck, S. ; Decoutere, S.
Author_Institution :
IMEC, Leuven, Belgium
Volume :
1
fYear :
1999
fDate :
13-15 Sept. 1999
Firstpage :
464
Lastpage :
467
Keywords :
CMOS technology; Degradation; Electronic mail; Intrusion detection; Least squares methods; MOSFET circuits; Physics; Semiconductor device modeling; Taylor series; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
Type :
conf
Filename :
1505540
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=440279
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