DocumentCode
440279
Title
A General Model for MOS Transistor Matching
Author
Croon, J.A. ; Rosmeulen, M. ; Van Huylenbroeck, S. ; Decoutere, S.
Author_Institution
IMEC, Leuven, Belgium
Volume
1
fYear
1999
fDate
13-15 Sept. 1999
Firstpage
464
Lastpage
467
Keywords
CMOS technology; Degradation; Electronic mail; Intrusion detection; Least squares methods; MOSFET circuits; Physics; Semiconductor device modeling; Taylor series; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location
Leuven, Belgium
Print_ISBN
2-86332-245-1
Type
conf
Filename
1505540
Link To Document