DocumentCode :
440293
Title :
0.15um Leff Buried Channel PFET Device Design
Author :
Rengarajan, R. ; Weybright, M. ; Faltermeier, J. ; Butt, S. ; Lee, H. ; Slisher, D. ; Ronsheim, P. ; Murphy, C.S. ; Dellow, M. ; Divakaruni, R.
Author_Institution :
Siemens Microelectronics Inc., Hopewell Junction, NY, USA
Volume :
1
fYear :
1999
fDate :
13-15 Sept. 1999
Firstpage :
536
Lastpage :
539
Keywords :
Aluminum; Boron; Costs; Dielectrics; Electric variables; Fabrication; Microelectronic implants; Random access memory; Space technology; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
Type :
conf
Filename :
1505558
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=440293