DocumentCode :
440294
Title :
A new method for temperature determination of integrated DMOSFETs
Author :
Sauter, Martin
Author_Institution :
Siemens AG, Munich, Germany
Volume :
1
fYear :
1999
fDate :
13-15 Sept. 1999
Firstpage :
540
Lastpage :
543
Keywords :
Calibration; Current measurement; Electric variables measurement; Electrical resistance measurement; Leakage current; Substrates; Temperature measurement; Testing; Thermal resistance; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
Type :
conf
Filename :
1505559
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=440294
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