Title :
A new method for temperature determination of integrated DMOSFETs
Author_Institution :
Siemens AG, Munich, Germany
Keywords :
Calibration; Current measurement; Electric variables measurement; Electrical resistance measurement; Leakage current; Substrates; Temperature measurement; Testing; Thermal resistance; Voltage;
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1