DocumentCode
440294
Title
A new method for temperature determination of integrated DMOSFETs
Author
Sauter, Martin
Author_Institution
Siemens AG, Munich, Germany
Volume
1
fYear
1999
fDate
13-15 Sept. 1999
Firstpage
540
Lastpage
543
Keywords
Calibration; Current measurement; Electric variables measurement; Electrical resistance measurement; Leakage current; Substrates; Temperature measurement; Testing; Thermal resistance; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location
Leuven, Belgium
Print_ISBN
2-86332-245-1
Type
conf
Filename
1505559
Link To Document