DocumentCode

440296

Title

Breakdown triggering in PM-HEMTs studied by means of Monte Carlo simulator

Author

Di Carlo, A. ; Rossi, L. ; Lugli, P. ; Meneghesso, G. ; Zanoni, E.

Author_Institution

Universita "Tor Vergata", Rome, Italy

Volume

1

fYear

1999

fDate

13-15 Sept. 1999

Firstpage

548

Lastpage

551

Keywords

Breakdown voltage; Charge carrier processes; DH-HEMTs; Electric breakdown; Gallium arsenide; HEMTs; Impact ionization; MESFETs; MODFETs; Monte Carlo methods;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 1999. Proceeding of the 29th European

Conference_Location

Leuven, Belgium

Print_ISBN

2-86332-245-1

Type

conf

Filename

1505561