مرکز منطقه ای اطلاع رساني علوم و فناوري - Reliable extraction of RF figures-of-merit for MOSFETs

DocumentCode :

440311

Title :

Reliable extraction of RF figures-of-merit for MOSFETs

Author :

Vandamme, E.P. ; Schreurs, D. ; Nauwelaers, B. ; van Dinther, C. ; Badenes, G. ; Deferm, L.

Author_Institution :

IMEC, Leuven, Belgium

Volume :

fYear :

1999

fDate :

13-15 Sept. 1999

Firstpage :

660

Lastpage :

663

Keywords :

CMOS technology; Extrapolation; Fingers; Frequency measurement; MOSFETs; Radio frequency; SPICE; Semiconductor device modeling; TV; Transducers;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Solid-State Device Research Conference, 1999. Proceeding of the 29th European

Conference_Location :

Leuven, Belgium

Print_ISBN :

2-86332-245-1

Type :

conf

Filename :

1505589

Link To Document :