Title :
Approaching the DT Bound Using Linear Codes in the Short Blocklength Regime
Author :
Salamanca, Luis ; Murillo-Fuentes, Juan Jose ; Olmos, Pablo M. ; Perez-Cruz, Fernando ; Verdu, Sergio
Author_Institution :
Luxembourg Centre for Syst. Biomed., Esch-sur-Alzette, Luxembourg
Abstract :
The dependence-testing (DT) bound is one of the strongest achievability bounds for the binary erasure channel (BEC) in the finite block length regime. In this paper, we show that maximum likelihood decoded regular low-density parity-check (LDPC) codes with at least 5 ones per column almost achieve the DT bound. Specifically, using quasi-regular LDPC codes with block length of 256 bits, we achieve a rate that is less than 1% away from the rate predicted by the DT bound for a word error rate below $10^{-3} $. The results also indicate that the maximum-likelihood solution is computationally feasible for decoding block codes over the BEC with several hundred bits.
Keywords :
binary codes; block codes; channel coding; linear codes; maximum likelihood decoding; parity check codes; DT bound; binary erasure channel; dependence-testing bound; finite block length regime; linear codes; maximum likelihood decoded regular low-density parity-check codes; quasiregular LDPC codes; short blocklength regime; word error rate; Channel coding; Complexity theory; Maximum likelihood decoding; Parity check codes; LDPC codes; ML decoding; binary erasure channel; finite blocklength regime; random coding;
Journal_Title :
Communications Letters, IEEE
DOI :
10.1109/LCOMM.2014.2371032