DocumentCode
44095
Title
Approaching the DT Bound Using Linear Codes in the Short Blocklength Regime
Author
Salamanca, Luis ; Murillo-Fuentes, Juan Jose ; Olmos, Pablo M. ; Perez-Cruz, Fernando ; Verdu, Sergio
Author_Institution
Luxembourg Centre for Syst. Biomed., Esch-sur-Alzette, Luxembourg
Volume
19
Issue
2
fYear
2015
fDate
Feb. 2015
Firstpage
123
Lastpage
126
Abstract
The dependence-testing (DT) bound is one of the strongest achievability bounds for the binary erasure channel (BEC) in the finite block length regime. In this paper, we show that maximum likelihood decoded regular low-density parity-check (LDPC) codes with at least 5 ones per column almost achieve the DT bound. Specifically, using quasi-regular LDPC codes with block length of 256 bits, we achieve a rate that is less than 1% away from the rate predicted by the DT bound for a word error rate below $10^{-3} $. The results also indicate that the maximum-likelihood solution is computationally feasible for decoding block codes over the BEC with several hundred bits.
Keywords
binary codes; block codes; channel coding; linear codes; maximum likelihood decoding; parity check codes; DT bound; binary erasure channel; dependence-testing bound; finite block length regime; linear codes; maximum likelihood decoded regular low-density parity-check codes; quasiregular LDPC codes; short blocklength regime; word error rate; Channel coding; Complexity theory; Maximum likelihood decoding; Parity check codes; LDPC codes; ML decoding; binary erasure channel; finite blocklength regime; random coding;
fLanguage
English
Journal_Title
Communications Letters, IEEE
Publisher
ieee
ISSN
1089-7798
Type
jour
DOI
10.1109/LCOMM.2014.2371032
Filename
6957577
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