Title :
Interpolation system for generating meteorological surfaces using to compute evapotranspiration in Haihe river basin
Author :
Qian, Qiaojing ; Wu, Bingfang ; Xiong, Jun
Author_Institution :
Inst. of Remote Sensing Applications, Chinese Acad. of Sci., Beijing, China
Abstract :
The generation of meteorological surfaces from point-source data is an overwork in computing evapotranspiration in Haihe river basin. To date, the software in common use can´t meet this demand. Here we offer a high efficient, flexible, integrated interpolation system that employs a database to store climate weather data, a choice of interpolation methods, validation and carry on batch processing. We performed validations for five meteorological variables (minimum and maximum temperature, relative humidity, average wind speed and air pressure) with inverse distance weighting (IDW), thin plate smoothing spline (SPLINE) and ordinary kriging (OK) and achieved comparable success among all interpolation methods. IDW and OK precision are superior to SPLINE, but SPLINE is more effective and smoothing. There is not too big difference between IDW and OK, and the precision obviously improves after temperature and pressure are revised with the terrain.
Keywords :
atmospheric humidity; atmospheric pressure; atmospheric temperature; batch processing (computers); climatology; geophysics computing; hydrological techniques; interpolation; meteorology; relational databases; rivers; splines (mathematics); statistical analysis; China; Haihe river basin; air pressure; atmospheric temperature; batch processing; climate weather data; database; evapotranspiration; interpolation system; inverse distance weighting; meteorological surfaces; meteorological variables; ordinary kriging; point-source data; relative humidity; thin plate smoothing spline; wind speed; Crops; Databases; Humidity; Interpolation; Meteorology; Rivers; Spline; Temperature; Water resources; Wind speed;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2005. IGARSS '05. Proceedings. 2005 IEEE International
Print_ISBN :
0-7803-9050-4
DOI :
10.1109/IGARSS.2005.1526250