DocumentCode :
441240
Title :
The improvement and validation of the model for retrieving the effective roughness length on TM pixel scale
Author :
Zhou, Yan-Lian ; Sun, Xiao-Min ; Zhang, Ren-Hua ; Zhu, Zhi-Lin ; Jing-Tian ; Xu, Jin-Ping ; Li, Zhao-Liang
Volume :
5
fYear :
2005
fDate :
25-29 July 2005
Firstpage :
3059
Lastpage :
3062
Keywords :
Aerodynamics; Atmospheric modeling; Backscatter; Land surface; Remote sensing; Rough surfaces; Solid modeling; Surface resistance; Surface roughness; Surface topography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2005. IGARSS '05. Proceedings. 2005 IEEE International
Print_ISBN :
0-7803-9050-4
Type :
conf
DOI :
10.1109/IGARSS.2005.1526482
Filename :
1526482
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=441240
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