• DocumentCode
    4413
  • Title

    Kudos to our reviewers

  • Author

    Oates, Anthony S.

  • Author_Institution
    Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan
  • Volume
    13
  • Issue
    4
  • fYear
    2013
  • fDate
    Dec. 2013
  • Firstpage
    427
  • Lastpage
    427
  • Abstract
    The publication offers a note of thanks to its reviewers.
  • Keywords
    IEEE publishing;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2013.2290154
  • Filename
    6677592
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=4413