DocumentCode
441611
Title
A Study On Temperature Distribution of arc Cross Section of Low-Voltage Apparatus
Author
Liu, Jiao-min ; Zhao, Jie ; Tan, Bai-Hong ; Wang, Zhen-zhou
Author_Institution
Heibei University of Technology, Tianjin 300130, China; E-MAIL: jmliu@hebust.edu.cn
Volume
1
fYear
2005
fDate
18-21 Aug. 2005
Firstpage
315
Lastpage
320
Abstract
In this paper, a set of hardware instruments used to collect arc radiant intensity in three directions were designed by using single area CCD based on high temperature characteristic of low-voltage apparatus switch arc, and the principle of computer tomogram and corresponding image processing software was also developed. We took pictures for the projection of breaking arc radiation of the low-voltage AC contactor in inductance circuits, and rebuilt its temperature distribution on different sections when burning.
Keywords
CCD; Low voltage apparatus; computer tomogram; switching arc; temperature field; Charge coupled devices; Contacts; Fourier transforms; Plasma measurements; Plasma temperature; Switches; Temperature distribution; Temperature measurement; Temperature sensors; Wavelength measurement; CCD; Low voltage apparatus; computer tomogram; switching arc; temperature field;
fLanguage
English
Publisher
ieee
Conference_Titel
Machine Learning and Cybernetics, 2005. Proceedings of 2005 International Conference on
Conference_Location
Guangzhou, China
Print_ISBN
0-7803-9091-1
Type
conf
DOI
10.1109/ICMLC.2005.1526965
Filename
1526965
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