DocumentCode
441993
Title
Cluster validity for DNA microarray data using a geometrical index
Author
Lam, Benson S Y ; Yan, Hong
Author_Institution
Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon, China
Volume
6
fYear
2005
fDate
18-21 Aug. 2005
Firstpage
3333
Abstract
A number of clustering methods have been used for DNA microarray data analysis. It is an important problem how to evaluate the results of these algorithms. In this paper, we introduce a new cluster validity index, which measures the geometrical feature of the data. The essential concept of this index is to measure the squared total length of the data eigen-axes with respect to the between-cluster separation. We show that this cluster validity index works well for data, which are close together or have different sizes. In our experiments, the proposed index is compared to five other validity indices and experiment results show that the proposed index gives more accurate results.
Keywords
DNA; biology computing; data analysis; data mining; pattern classification; statistical analysis; DNA microarray data analysis; cluster validity index; geometrical feature; pattern classification; Biology computing; Clustering algorithms; Clustering methods; Cost function; DNA; Data analysis; Data engineering; Data mining; Length measurement; Pattern classification; Cluster Validity; DNA microarray Data Analysis; Pattern Classification;
fLanguage
English
Publisher
ieee
Conference_Titel
Machine Learning and Cybernetics, 2005. Proceedings of 2005 International Conference on
Conference_Location
Guangzhou, China
Print_ISBN
0-7803-9091-1
Type
conf
DOI
10.1109/ICMLC.2005.1527518
Filename
1527518
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