DocumentCode :
441993
Title :
Cluster validity for DNA microarray data using a geometrical index
Author :
Lam, Benson S Y ; Yan, Hong
Author_Institution :
Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon, China
Volume :
6
fYear :
2005
fDate :
18-21 Aug. 2005
Firstpage :
3333
Abstract :
A number of clustering methods have been used for DNA microarray data analysis. It is an important problem how to evaluate the results of these algorithms. In this paper, we introduce a new cluster validity index, which measures the geometrical feature of the data. The essential concept of this index is to measure the squared total length of the data eigen-axes with respect to the between-cluster separation. We show that this cluster validity index works well for data, which are close together or have different sizes. In our experiments, the proposed index is compared to five other validity indices and experiment results show that the proposed index gives more accurate results.
Keywords :
DNA; biology computing; data analysis; data mining; pattern classification; statistical analysis; DNA microarray data analysis; cluster validity index; geometrical feature; pattern classification; Biology computing; Clustering algorithms; Clustering methods; Cost function; DNA; Data analysis; Data engineering; Data mining; Length measurement; Pattern classification; Cluster Validity; DNA microarray Data Analysis; Pattern Classification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Machine Learning and Cybernetics, 2005. Proceedings of 2005 International Conference on
Conference_Location :
Guangzhou, China
Print_ISBN :
0-7803-9091-1
Type :
conf
DOI :
10.1109/ICMLC.2005.1527518
Filename :
1527518
Link To Document :
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