• DocumentCode
    441993
  • Title

    Cluster validity for DNA microarray data using a geometrical index

  • Author

    Lam, Benson S Y ; Yan, Hong

  • Author_Institution
    Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon, China
  • Volume
    6
  • fYear
    2005
  • fDate
    18-21 Aug. 2005
  • Firstpage
    3333
  • Abstract
    A number of clustering methods have been used for DNA microarray data analysis. It is an important problem how to evaluate the results of these algorithms. In this paper, we introduce a new cluster validity index, which measures the geometrical feature of the data. The essential concept of this index is to measure the squared total length of the data eigen-axes with respect to the between-cluster separation. We show that this cluster validity index works well for data, which are close together or have different sizes. In our experiments, the proposed index is compared to five other validity indices and experiment results show that the proposed index gives more accurate results.
  • Keywords
    DNA; biology computing; data analysis; data mining; pattern classification; statistical analysis; DNA microarray data analysis; cluster validity index; geometrical feature; pattern classification; Biology computing; Clustering algorithms; Clustering methods; Cost function; DNA; Data analysis; Data engineering; Data mining; Length measurement; Pattern classification; Cluster Validity; DNA microarray Data Analysis; Pattern Classification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Machine Learning and Cybernetics, 2005. Proceedings of 2005 International Conference on
  • Conference_Location
    Guangzhou, China
  • Print_ISBN
    0-7803-9091-1
  • Type

    conf

  • DOI
    10.1109/ICMLC.2005.1527518
  • Filename
    1527518