Title :
Common systematic errors in sampling applications and their compensation
Author :
Hlupic, N. ; Butorac, J.
Author_Institution :
Fac. of Electr. Eng. & Comput., Zagreb Univ., Croatia
Abstract :
A sampling method for measurement of all relevant systematic sampling errors (parameters) of a device is presented. One can determine error of sampling frequency, integration interval inaccuracy and latency time. All sampling parameters can be determined with relative error less than 10/spl middot/10/sup -6/, except latency time whose absolute accuracy is about 50 ns. Also, the reader is directed how to neutralize effects caused by these sampling imperfections.
Keywords :
signal sampling; common systematic errors; latency time; sampling applications; Delay effects; Electric variables measurement; Frequency; Hardware; Instruments; Manufacturing; Sampling methods; Signal processing algorithms; Signal sampling; Voltmeters;
Conference_Titel :
Industrial Electronics, 2005. ISIE 2005. Proceedings of the IEEE International Symposium on
Conference_Location :
Dubrovnik, Croatia
Print_ISBN :
0-7803-8738-4
DOI :
10.1109/ISIE.2005.1529096
