Title :
Wavelet-based texture features: a new method for sub-band characterization
Author :
Mourougaya, François ; Carré, Philippe ; Fernandez-Maloigne, Christine
Author_Institution :
SIC Lab., Poitiers Univ., France
Abstract :
This paper introduces a new strategy to describe wavelet sub-bands in the scope of texture characterization. While most wavelet-based texture features found in the literature do not use spatial information contained in the wavelet domain, the new approach suggests to represent sub-bands of a texture by shape parameters. This new technique is called wavelet geometrical features (WGF), and is coming from a multiresolution extension of Chen´s statistical geometrical features (SGF). Experiments on the full Brodatz database show the efficiency of the WGF over the SGF and the traditional wavelet energy signature.
Keywords :
feature extraction; image classification; image texture; statistical analysis; wavelet transforms; Brodatz database; Chen statistical geometrical features; multiresolution extension; shape parameters; spatial information; subband characterization; texture characterization; wavelet domain; wavelet energy signature; wavelet geometrical features; wavelet-based texture features; Energy resolution; Humans; Image segmentation; Laboratories; Shape; Silicon carbide; Spatial databases; Spatial resolution; Wavelet domain; Wavelet transforms; Geometrical Features; Texture classification; Wavelet transform;
Conference_Titel :
Image Processing, 2005. ICIP 2005. IEEE International Conference on
Print_ISBN :
0-7803-9134-9
DOI :
10.1109/ICIP.2005.1529783