DocumentCode
443203
Title
A fast-lock mixed-mode DLL with wide-range operation and multiphase outputs
Author
Cheng, Kuo-Hsing ; Lo, Yu-Lung
Author_Institution
Dept. of Electr. Eng., Nat. Central Univ., Taoyuan, Taiwan
fYear
2005
fDate
12-16 Sept. 2005
Firstpage
189
Lastpage
192
Abstract
This paper describes a fast-lock mixed-mode delay-locked loop (MMDLL) for wide-range operation and multiphase outputs. The architecture of the proposed DLL uses the mixed-mode time-to-digital converter (TDC) scheme for frequency range selector, a start-up circuit and coarse tune circuit to offer the faster lock time. And the multi-controlled delay cell for voltage-controlled delay line (VCDL) was used to provide the wide locked range and low-jitter performance. The charge pump circuit is implemented by digital controlled scheme to reach bandwidth tracking. The chip has been fabricated using the TSMC 0.25-μm single-poly five-metal CMOS process with a 2.5 V power supply voltage. From the measurement results, this DLL can operate correctly when the input clock frequency is changed from 32 to 320 MHz and generate ten-phase clocks within just one clock cycle. Moreover, the proposed DLL can solve the problem of the false locking associated with conventional DLLs and wide-range operation. At 320 MHz, the measured peak-to-peak jitter and root-mean-squared jitter are 37.2 ps and 2.492 ps, respectively. Furthermore, the locking time is less than 22 clock cycles based on the HSPICE simulation results. The DLL occupies smaller area (0.32 × 0.22 mm2) and dissipates less power (15 mW) than other wide-range DLLs presented in Y. J. Jung et al. (2001), D. J. Foley et al. (2001), Y. Moon et al. (2000), B. W. Garlepp et al. (1999), H. H. Chang et al. (2002), S. Sidiropoulos et al. (1997) and S. J. Kim et al. (2002).
Keywords
CMOS integrated circuits; delay lines; delay lock loops; mixed analogue-digital integrated circuits; voltage multipliers; 0.25 micron; 2.492 ps; 2.5 V; 32 MHz; 320 MHz; 37.2 ps; bandwidth tracking; charge pump circuit; coarse tune circuit; delay-locked loops; false locking problem; fast-lock DLL; frequency range selector; low-jitter performance; mixed-mode DLL; multicontrolled delay cell; multiphase outputs; peak-to-peak jitter; root-mean-squared jitter; start-up circuit; time-to-digital converter; voltage-controlled delay line; wide-range operation; Bandwidth; CMOS process; Charge pumps; Clocks; Delay lines; Digital control; Frequency conversion; Jitter; Tuned circuits; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 2005. ESSCIRC 2005. Proceedings of the 31st European
Print_ISBN
0-7803-9205-1
Type
conf
DOI
10.1109/ESSCIR.2005.1541591
Filename
1541591
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