Title :
Advances in Light Trapping for Hydrogenated Nanocrystalline Silicon Solar Cells
Author :
Sivec, Laura ; Yan, Baojie ; Yue, Guozhen ; Owens-Mawson, Jessica ; Yang, Jeffrey ; Guha, Subhendu
Author_Institution :
United Solar Ovonic LLC, Troy, MI, USA
Abstract :
We optimized Ag/ZnO back reflectors (BR) for hydrogenated nanocrystalline silicon (nc-Si:H) solar cells by independently changing the textures of the Ag and ZnO layers. We found that Ag/ZnO with textured Ag and thin ZnO provides the highest nc-Si:H solar cell efficiency. Optimized Ag texture with an rms = 40 nm effectively scatters light without seriously degrading the nc-Si:H material quality. Using this type of BR and nc-Si:H cells with ~1-μm-thick intrinsic layer, we obtained a short-circuit current density Jsc = 24.6 mA/cm2 and conversion efficiency Eff = 9.47%. By increasing the nc-Si:H layer to ~3.1 μm, we attained a Jsc >;30 mA/cm2. In order to increase the Jsc further, we increased the texture of the ZnO layer. With highly textured Ag/ZnO BRs, the Jsc was increased. However, the high textures caused poor fill factors, and hence, relatively low efficiency. By using nanocrystalline silicon-oxide (nc-SiOx:H) to replace both the n-layer and dielectric layer, the texture-induced deterioration of nc-Si:H material quality was suppressed and the cell structure was simplified by removing the ZnO, conventional n-layer, n/i buffer layer, and the seed layer. A high Jsc over 27 mA/cm2 and high-cell efficiency of 8.8% were attained using a 2.5-μm-thick nc-Si:H cell with an nc-SiOx:H n-layer.
Keywords :
II-VI semiconductors; buffer layers; current density; elemental semiconductors; hydrogen; light scattering; nanostructured materials; optical elements; semiconductor thin films; short-circuit currents; silicon; silver; solar cells; wide band gap semiconductors; zinc compounds; Ag-ZnO-Si:H; SiOx:H-Si:H; back reflectors; cell structure; conversion efficiency; dielectric layer; fill factors; hydrogenated nanocrystalline silicon solar cells; light trapping; seed layer; short-circuit current density; size 2.5 mum; texture-induced deterioration; Charge carrier processes; Loss measurement; Materials; Photoconductivity; Photovoltaic cells; Standards; Zinc oxide; Amorphous semiconductors; back reflector (BR); photovoltaic cells; silicon devices; solar energy; thin-film devices;
Journal_Title :
Photovoltaics, IEEE Journal of
DOI :
10.1109/JPHOTOV.2012.2216509