DocumentCode
444170
Title
Terahertz near-field microscopy
Author
Planken, P. C M ; van Rijmenam, C.W.E.M. ; van der Valk, N.C.J.
Author_Institution
Fac. of Appl. Sci., Delft Univ. of Technol., Netherlands
Volume
1
fYear
2005
fDate
22-27 May 2005
Firstpage
440
Abstract
We present results on the spatial extent and origin of the near-field of a metal tip and the first measurement on a crystal of CsI using THz apertureless scanning near-field optical microscopy.
Keywords
caesium compounds; near-field scanning optical microscopy; optical materials; submillimetre wave imaging; CsI; CsI crystal; THz apertureless scanning near-field optical microscopy; metal tip; spatial extent; Biomedical optical imaging; Crystals; Face detection; Frequency; Optical imaging; Optical microscopy; Probes; Shafts; Spectroscopy; Ultrafast optics;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics and Laser Science Conference, 2005. QELS '05
Print_ISBN
1-55752-796-2
Type
conf
DOI
10.1109/QELS.2005.1548809
Filename
1548809
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