Title :
Single-Event Transient Induced Harmonic Errors in Digitally Controlled Ring Oscillators
Author :
Chen, Yongpin P. ; Loveless, T.D. ; Maillard, P. ; Gaspard, N.J. ; Jagannathan, Sarangapani ; Sternberg, A.L. ; Zhang, E.X. ; Witulski, A.F. ; Bhuva, B.L. ; Holman, T.W. ; Massengill, Lloyd W.
Author_Institution :
Vanderbilt Univ., Nashville, TN, USA
Abstract :
Single-event transient (SET) induced harmonic errors have been observed in digitally controlled ring oscillators (DCRO). Accumulated phase error is used to characterize harmonic errors in ring oscillator circuits. An analytical model for determining minimum and maximum SET transient duration capable of generating a harmonic is described. Simulation and TPA laser experimental results on a 40-nm DCRO are shown to confirm the assertion of the harmonic vulnerability window with respect to SET pulsewidth. Further more, fault injection experimental results on three RO designs built with discrete commercial off-the-shelf components are included to demonstrate the relationship between harmonic response and SET pulsewidth.
Keywords :
digital circuits; oscillators; radiation hardening (electronics); DCRO; RO designs; SET pulsewidth; TPA laser; accumulated phase error; analytical model; digitally controlled ring oscillators; discrete commercial off-the-shelf components; fault injection; harmonic response; harmonic vulnerability window assertion; maximum SET transient duration; minimum SET transient duration; single-event transient induced harmonic errors; size 40 nm; Analytical models; Digital circuits; Digital-controlled oscillators; Harmonic analysis; Phase locked loops; Ring oscillators; Single event transients; Transient analysis; ADPLL; DCO; digital circuits; harmonic error; ring oscillator; single-event transient (SET);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2014.2364813