Title :
Mask design for the space interferometry mission internal metrology
Author :
Marx, David ; Zhao, Feng ; Korechoff, Robert
Author_Institution :
Jet Propulsion Lab., Pasadena, CA, USA
Abstract :
Heterodyne laser interferometers are used to measure the changes in optical path length of the arms of stellar interferometers. Numerical diffraction analysis is used to design masks, constrained by diffraction, crosstalk, and power loss requirements.
Keywords :
astronomical techniques; light interferometers; masks; measurement by laser beam; numerical analysis; optical design techniques; optical variables measurement; crosstalk; heterodyne laser interferometer; internal metrology; mask design; numerical diffraction analysis; optical path length measurement; power loss; space interferometry mission; stellar interferometer; Arm; Interferometers; Laser transitions; Length measurement; Metrology; Optical crosstalk; Optical diffraction; Optical interferometry; Optical mixing; Space missions;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2005. QELS '05
Print_ISBN :
1-55752-796-2
DOI :
10.1109/QELS.2005.1549069
