• DocumentCode
    444428
  • Title

    Extended InGaAs/InGaAs quantum structures for near infrared photodetection beyond 1.9 μm

  • Author

    Fu, Junxian ; Yu, Xiaojun ; Kuo, Yu-Hsuan ; Harris, James S., Jr.

  • Author_Institution
    Dept. of Appl. Phys., Stanford Univ., CA, USA
  • Volume
    2
  • fYear
    2005
  • fDate
    22-27 May 2005
  • Firstpage
    1266
  • Abstract
    Extended InGaAs quantum structures were grown on InP substrate using two strain compensation techniques by molecular beam epitaxy. The material quality was characterized and the absorption coefficient was measured with transmission spectroscopy.
  • Keywords
    III-V semiconductors; absorption coefficients; gallium arsenide; gallium compounds; indium compounds; infrared detectors; molecular beam epitaxial growth; photodetectors; semiconductor growth; semiconductor quantum wells; InGaAs-InGaAs; InGaAs-InP; InP; InP substrate; absorption coefficient; extended InGaAs-InGaAs quantum structures; material quality; molecular beam epitaxy; near infrared photodetection; transmission spectroscopy; two strain compensation techniques; Absorption; Capacitive sensors; Flexible manufacturing systems; Indium gallium arsenide; Indium phosphide; Optical buffering; Optical materials; Optical sensors; Optical superlattices; Spectroscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics and Laser Science Conference, 2005. QELS '05
  • Print_ISBN
    1-55752-796-2
  • Type

    conf

  • DOI
    10.1109/QELS.2005.1549100
  • Filename
    1549100