Title :
Modeling target variability using the SBR technique [radar applications]
Author :
Bhalla, Rajan ; Moore, John ; Ryan, Patti ; Velten, Vincent J. ; Branch, Eric
Author_Institution :
SAIC, Champaign, IL, USA
Abstract :
In this paper, we presented an approach to predict the statistical moments of radar cross section due to dimensional variability when using the SBR (shooting and bouncing ray tracing) technique. The various sources of dimension variability include manufacturing tolerances and CAD modeling errors due to limited knowledge of the target. Though we derived the first two moments, higher order moments can also be systematically derived using this methodology. This approach can also be extended to other sources of target and sensor variabilities.
Keywords :
electromagnetic wave propagation; radar cross-sections; radar signal processing; ray tracing; statistical analysis; CAD modeling errors; RCS statistical moments; SBR technique; Xpatch; dimension variability; limited target knowledge; manufacturing tolerances; radar cross sections; radar signature target variability; shooting/bouncing ray tracing; stochastic EM formulation; Aircraft; Electromagnetic forces; Electromagnetic scattering; Frequency; Laboratories; Manufacturing; Optical scattering; Radar scattering; Random variables; Stochastic processes;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2005 IEEE
Print_ISBN :
0-7803-8883-6
DOI :
10.1109/APS.2005.1551229