Title :
Numerical study of wide-band low-grazing HF clutter from ocean-like surfaces
Author :
Toporkov, Jakov V. ; Sletten, Mark A.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Abstract :
Backscattering of a vertically polarized, ultra-wide band HF pulse (3-30 MHz) from one-dimensional Pierson-Moskowitz impedance surfaces is studied using method of moments (MoM)-based numerical simulations. With the field source located near the surface, low-gazing regime is realized for the most of the illuminated region. The direct numerical solution is compared to approximate calculations based on the small perturbation method (SPM). Once the Norton surface wave effects are included in the SPM scattering coefficient, average clutter levels as well as waveform shapes generally show good agreement. As the sea state increases, backscatter returns from farther ranges exhibit larger discrepancies. In such a situation, using the "effective surface impedance" (that accounts for surface roughness) brings SPM-based average clutter levels in agreement with their MoM counterparts: however, the differences in waveform shapes persist. Future studies will use the simulation capability described in this paper to investigate the ability of a short-pulse, ultrawideband HF radar to image ocean waves, measure surface currents and surface current shear, and detect targets.
Keywords :
HF radio propagation; backscatter; clutter; electromagnetic wave polarisation; electromagnetic wave scattering; method of moments; oceanographic techniques; perturbation techniques; remote sensing; surface impedance; surface roughness; MoM; Norton surface wave effects; SPM scattering coefficient; average clutter levels; backscattering; effective surface impedance; method of moments; ocean-like surfaces; one-dimensional Pierson-Moskowitz impedance surfaces; sea state; small perturbation method; surface roughness; ultra-wide band HF pulse; vertically polarized HF pulse; waveform shapes; wide-band low-grazing HF clutter; Backscatter; Clutter; Hafnium; Rough surfaces; Scanning probe microscopy; Sea surface; Surface impedance; Surface roughness; Surface waves; Wideband;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2005 IEEE
Print_ISBN :
0-7803-8883-6
DOI :
10.1109/APS.2005.1551333