Title :
Investigations of manufacture artifacts on nano-scale FSS performance
Author :
Qiang, Rui ; Chen, Ji
Author_Institution :
Dept. of Electr. & Comput. Eng., Houston Univ., TX, USA
Abstract :
The effects of several critical manufacturing artifacts on the performance of nano-scale frequency selective surfaces are investigated. The study is performed via a frequency-dependent FDTD modeling tool that includes surface plasmon effects. Simulation results are verified via experimental data. Our investigations show that manufacturing artifacts can lead to significant variations in infrared filter performance.
Keywords :
finite difference time-domain analysis; frequency selective surfaces; nanopatterning; optical filters; surface plasmons; frequency-dependent FDTD modeling tool; manufacturing artifacts; nano-scale FSS performance; nano-scale frequency selective surfaces; periodic patterns; surface plasmon effects; Finite difference methods; Frequency selective surfaces; Microwave filters; Optical films; Optical filters; Optical surface waves; Plasmons; Throughput; Time domain analysis; Virtual manufacturing;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2005 IEEE
Print_ISBN :
0-7803-8883-6
DOI :
10.1109/APS.2005.1551418
