• DocumentCode
    444765
  • Title

    Characterization of high impedance surfaces using magnitude measurements

  • Author

    Amert, Tony ; Glover, Brian ; Whites, Keith W.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., South Dakota Sch. of Mines & Technol., Rapid City, SD
  • Volume
    1B
  • fYear
    2005
  • fDate
    8-8 July 2005
  • Firstpage
    640
  • Abstract
    High impedance surfaces are generally characterized by reflection coefficient measurements. Other methods such as surface wave suppression measurements are used but do not provide as useful information. For ideal lossless high impedance surfaces the reflection coefficient magnitude is one while the phase angle varies greatly with frequency. However, by placing a resistive sheet near the high impedance surface, the magnitude of the reflection coefficient can also be made to vary with frequency
  • Keywords
    electric impedance; electromagnetic wave reflection; high-impedance surfaces; magnitude measurements; phase angle; reflection coefficient measurements; resistive sheet; Antenna measurements; Copper; Electric variables measurement; Electromagnetic measurements; Frequency measurement; Impedance measurement; Reflection; Resonant frequency; Surface impedance; Surface resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2005 IEEE
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-8883-6
  • Type

    conf

  • DOI
    10.1109/APS.2005.1551641
  • Filename
    1551641