DocumentCode :
444765
Title :
Characterization of high impedance surfaces using magnitude measurements
Author :
Amert, Tony ; Glover, Brian ; Whites, Keith W.
Author_Institution :
Dept. of Electr. & Comput. Eng., South Dakota Sch. of Mines & Technol., Rapid City, SD
Volume :
1B
fYear :
2005
fDate :
8-8 July 2005
Firstpage :
640
Abstract :
High impedance surfaces are generally characterized by reflection coefficient measurements. Other methods such as surface wave suppression measurements are used but do not provide as useful information. For ideal lossless high impedance surfaces the reflection coefficient magnitude is one while the phase angle varies greatly with frequency. However, by placing a resistive sheet near the high impedance surface, the magnitude of the reflection coefficient can also be made to vary with frequency
Keywords :
electric impedance; electromagnetic wave reflection; high-impedance surfaces; magnitude measurements; phase angle; reflection coefficient measurements; resistive sheet; Antenna measurements; Copper; Electric variables measurement; Electromagnetic measurements; Frequency measurement; Impedance measurement; Reflection; Resonant frequency; Surface impedance; Surface resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2005 IEEE
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-8883-6
Type :
conf
DOI :
10.1109/APS.2005.1551641
Filename :
1551641
Link To Document :
بازگشت