DocumentCode
445006
Title
An SVD approach to large reflector diagnostics
Author
Mazzarella, Giuseppe ; Serra, Giampaolo
Author_Institution
Dip. Ingegneria Elettrica ed Elettronica, Cagliari Univ., Italy
Volume
2B
fYear
2005
fDate
3-8 July 2005
Firstpage
756
Abstract
The retrieval of the surface profile of a reflector antenna is an important issue, mainly for the radioastronomical ones. A new technique based on the singular value decomposition is proposed here to retrieve the reflector profile starting from a small set of far-field data. A number of examples for axis-symmetric deformations assess the procedure.
Keywords
antenna radiation patterns; radiotelescopes; reflector antennas; singular value decomposition; SVD; axis-symmetric deformations; far-field data; large reflector diagnostics; radioastronomical antennas; reflector antenna; singular value decomposition; surface profile; Antenna measurements; Current measurement; Degradation; Equations; Information retrieval; Linear systems; Performance evaluation; Reflector antennas; Singular value decomposition; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2005 IEEE
Print_ISBN
0-7803-8883-6
Type
conf
DOI
10.1109/APS.2005.1552126
Filename
1552126
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