Title :
An SVD approach to large reflector diagnostics
Author :
Mazzarella, Giuseppe ; Serra, Giampaolo
Author_Institution :
Dip. Ingegneria Elettrica ed Elettronica, Cagliari Univ., Italy
Abstract :
The retrieval of the surface profile of a reflector antenna is an important issue, mainly for the radioastronomical ones. A new technique based on the singular value decomposition is proposed here to retrieve the reflector profile starting from a small set of far-field data. A number of examples for axis-symmetric deformations assess the procedure.
Keywords :
antenna radiation patterns; radiotelescopes; reflector antennas; singular value decomposition; SVD; axis-symmetric deformations; far-field data; large reflector diagnostics; radioastronomical antennas; reflector antenna; singular value decomposition; surface profile; Antenna measurements; Current measurement; Degradation; Equations; Information retrieval; Linear systems; Performance evaluation; Reflector antennas; Singular value decomposition; Testing;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2005 IEEE
Print_ISBN :
0-7803-8883-6
DOI :
10.1109/APS.2005.1552126
