DocumentCode :
445208
Title :
Multi-Ricean modeling of site-specific indoor channel in wireless communications
Author :
Lim, C.P. ; Volakis, J.L. ; Anastasopoulos, A.
Author_Institution :
ElectroScience Lab, Ohio State Univ., Columbus, OH, USA
Volume :
3B
fYear :
2005
fDate :
3-8 July 2005
Firstpage :
402
Abstract :
The paper focuses on systems employing multiple antennas. For modeling the statistics of these systems, we adopt the multi-Ricean fading approach. Specifically, we consider various binary modulated signals over our multi-Ricean fading channel. In doing so, the average bit error rate (BER) is also computed. As theoretical studies have demonstrated, BER improves with the deployment of additional antennas and we therefore examine the dependency of network capacity on the number of antennas used as a function of transmitting positions. Based on a rigorous and validated full-wave method, we extract statistical parameters (i.e., K-factor) for an indoor site-specific environment with multiple antennas. These statistics are subsequently used to compute the BER. We also provide useful information pertaining to site-planning via BER over the considered multi-Ricean fading channel. Specifically, we observe a significant improvement in capacity, not only by using multiple antennas, but also by choosing optimal locations for these antennas.
Keywords :
Rician channels; error statistics; indoor radio; statistical analysis; telecommunication network planning; BER; K-factor; binary modulated signals; bit error rate; full-wave method; indoor site-specific environment; multi-Ricean fading channel; multiple antennas; network capacity; site-specific indoor channel; statistical parameters; transmitting positions; wireless communications; Antennas and propagation; Bit error rate; Delay; Fading; Finite difference methods; MIMO; Power system modeling; Time domain analysis; Transmitting antennas; Wireless communication;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2005 IEEE
Print_ISBN :
0-7803-8883-6
Type :
conf
DOI :
10.1109/APS.2005.1552528
Filename :
1552528
Link To Document :
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