Hradsky, B. ; Muralidhar, R. ; Rao, R.A. ; Steimle, B. ; Straub, S. ; White, B.E., Jr. ; Sadd, M. ; Anderson, S.G.H. ; Yater, J.A. ; Swift, C.T. ; Acred, B. ; Peschke, J. ; Prinz, E.J. ; Chang, K.M.
Volume :
1
fYear :
2005
fDate :
June 20-22, 2005
Firstpage :
37
Lastpage :
38
Keywords :
Atomic layer deposition; Electrons; Energy states; Human computer interaction; Manufacturing processes; Nanocrystals; Nonvolatile memory; Silicon; Temperature sensors; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference Digest, 2005. DRC '05. 63rd
