DocumentCode :
445323
Title :
Vertical-structured Ni/n-GaN schottky diode with electroplating nickel substrate
Author :
Wang, Shui-Jinn ; Chang, Shu-Cheng ; Uang, Kai-Ming ; Liou, Bor-Wen
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan
Volume :
1
fYear :
2005
fDate :
22-22 June 2005
Firstpage :
59
Lastpage :
60
Abstract :
For the past decade, most of vertical device applications of GaN were processed by either wafer bonding or direct epitaxy on SiC or GaN wafer. However, the former usually suffers from large strain between GaN and bonding wafer because the high temperature and high pressure bonding process, and the later is not cost effective because of using SiC or GaN substrate. In this work, a novel vertical structure of Ni/n-GaN Schottky barrier diode (SBD) with metallic substrate employing nickel electroplating and laser lift-off (LLO) processes is proposed and its electrical characteristics is reported
Keywords :
Schottky diodes; electroplating; gallium compounds; laser beam etching; nickel; semiconductor technology; substrates; wide band gap semiconductors; Ni-GaN; Schottky barrier diode; laser lift-off processes; metallic substrate; nickel electroplating; vertical-structured Schottky diode; Bonding processes; Capacitive sensors; Epitaxial growth; Gallium nitride; Nickel; Schottky diodes; Silicon carbide; Substrates; Temperature; Wafer bonding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference Digest, 2005. DRC '05. 63rd
Conference_Location :
Santa Barbara, CA
Print_ISBN :
0-7803-9040-7
Type :
conf
DOI :
10.1109/DRC.2005.1553054
Filename :
1553054
Link To Document :
بازگشت