Title :
Long term transients in MOSFEG 1/f noise under switched bias conditions
Author :
Louie, M.Y. ; Miller, D.A. ; Jacob, M.E. ; Forbes, L.
Keywords :
Circuit noise; Circuit testing; Frequency dependence; Frequency measurement; Low-frequency noise; MOSFET circuits; Noise measurement; Noise reduction; Threshold voltage; Zero voltage switching;
Conference_Titel :
Device Research Conference Digest, 2005. DRC '05. 63rd
Print_ISBN :
0-7803-9040-7
DOI :
10.1109/DRC.2005.1553064
