Title :
Device scaling in COSMOS architecture
Author :
Al-Ahmadi, Ahmad ; Kaya, Savas
Keywords :
Buildings; CMOS process; Capacitive sensors; Charge carrier processes; Circuit simulation; Delay; Doping; Electron mobility; MOSFET circuits; Silicon on insulator technology;
Conference_Titel :
Device Research Conference Digest, 2005. DRC '05. 63rd
Print_ISBN :
0-7803-9040-7
DOI :
10.1109/DRC.2005.1553071
