DocumentCode
445339
Title
Device scaling in COSMOS architecture
Author
Al-Ahmadi, Ahmad ; Kaya, Savas
Volume
1
fYear
2005
fDate
June 20-22, 2005
Firstpage
93
Lastpage
94
Keywords
Buildings; CMOS process; Capacitive sensors; Charge carrier processes; Circuit simulation; Delay; Doping; Electron mobility; MOSFET circuits; Silicon on insulator technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference Digest, 2005. DRC '05. 63rd
Print_ISBN
0-7803-9040-7
Type
conf
DOI
10.1109/DRC.2005.1553071
Filename
1553071
Link To Document