Title :
Phonon modification in SOI structures and its impact on electron transport
Author :
Uno, Shigeyasu ; Mori, Nobuya
Keywords :
Acoustic scattering; Acoustical engineering; Capacitive sensors; Educational institutions; Electrons; Frequency; Phonons; Silicon on insulator technology; Stress; Wave functions;
Conference_Titel :
Device Research Conference Digest, 2005. DRC '05. 63rd
Print_ISBN :
0-7803-9040-7
DOI :
10.1109/DRC.2005.1553131
