Title :
Impact of the nanotube diameter on the performance of CNFETs
Author :
Chen, Zhihong ; Appenzeller, Joerg ; Knoch, Joachim ; Lin, Yu-Ming ; Avouris, Phaedon
Author_Institution :
IBMT. J. Watson Res. Center, Yorktown Heights, NY
Abstract :
This study investigates 38 CNFETs and shows that nearly 3 orders of magnitude current variation can be explained in a comprehensive way by the diameter variation among nanotubes alone. This is the first systematic analysis that correlates the device performance with the nanotube properties quantitatively. It also shows that one can neglect the impact of the preparation on the contact quality to a large extend
Keywords :
carbon nanotubes; field effect devices; nanotube devices; CNFET; contact quality; diameter variation; magnitude current variation; nanotube diameter; CNTFETs; Geometrical optics; Geometry; MOSFETs; Nanoscale devices; Nanotube devices; Performance analysis; Photonic band gap; Thin film devices; Thin film transistors;
Conference_Titel :
Device Research Conference Digest, 2005. DRC '05. 63rd
Conference_Location :
Santa Barbara, CA
Print_ISBN :
0-7803-9040-7
DOI :
10.1109/DRC.2005.1553137
