• DocumentCode
    445385
  • Title

    Electric field effect transport in mesoscopic graphite and graphene

  • Author

    Kim, P.

  • Volume
    1
  • fYear
    2005
  • fDate
    20-22 June 2005
  • Firstpage
    251
  • Lastpage
    251
  • Abstract
    Summary form only given, as follows. The recent focus of research in graphitic materials, such as fullerenes and carbon nanotubes has renewed interest in electronic transport in graphene, a single atomic layer of graphite. While graphite is a semimetal with strong electron and hole compensation, graphene is expected to be a zero-gap semiconductor with a vanishing density of states at the charge neutral point. Electrical transport in thin graphite crystals composed of only a few graphene layers is of particular interest in elucidating the evolution of electronic structure from bulk single crystals to two-dimensional planar systems. In this talk, we present results from the electric field effect dependent magnetoresistance and Hall resistance measurements in mesoscopic graphite crystallites consisting of as few as tens of atomic layers and also the measurements in graphene, a single sheet limit of graphite. The mesoscopic graphite devices used in this experiment are fabricated using a unique micro-mechanical method. Strong modulation of magneto-resistance and Hall resistance as a function of gate voltage is observed as sample thickness approaches the screening length. The electric-field effect changes the sign of the dominant majority carrier, hence reverses the sign of the Hall coefficient. Electric field dependent Landau level formation is detected from Shubnikov de Haas oscillations in the magneto-resistance. The effective mass of electron and hole carriers has been measured from the temperature dependent behavior of these oscillations.
  • Keywords
    Atomic layer deposition; Atomic measurements; Carbon nanotubes; Charge carrier processes; Crystallization; Electrical resistance measurement; Magnetic field measurement; Organic materials; Semiconductor materials; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference Digest, 2005. DRC '05. 63rd
  • Conference_Location
    Santa Barbara, CA
  • Print_ISBN
    0-7803-9040-7
  • Type

    conf

  • DOI
    10.1109/DRC.2005.1553143
  • Filename
    1553143