Title :
Laser polarimetry and leaf cuticle characteristics
Author :
Tsaruk, Aleh V. ; Vashchula, Ihar V. ; Zhumar, A.Yu.
Author_Institution :
Inst. of Phys., Nat. Acad. of Sci. of Belarus, Minsk, Belarus
Abstract :
The appearance of elliptical polarization for reflected by plant leaves linear polarized radiation was investigated.. The leaf cuticle reflectance model was proposed. The evaluation of refractive index and mean angle of cuticle roughness to leaf surface was carried out.
Keywords :
bio-optics; biological techniques; biomembranes; botany; measurement by laser beam; polarimetry; refractive index; surface roughness; elliptical polarization; laser polarimetry; leaf cuticle characteristics; leaf cuticle reflectance model; leaf cuticle surface roughness; linear polarized radiation; plant leaves; refractive index; Azimuth; Electromagnetic radiation; Laser beam cutting; Optical polarization; Polarimetry; Refractive index; Rough surfaces; Surface morphology; Surface roughness; Wavelength measurement;
Conference_Titel :
Advanced Optoelectronics and Lasers, 2005. Proceedings of CAOL 2005. Second International Conference on
Print_ISBN :
0-7803-9130-6
DOI :
10.1109/CAOL.2005.1553888
