DocumentCode
445450
Title
Laser polarimetry and leaf cuticle characteristics
Author
Tsaruk, Aleh V. ; Vashchula, Ihar V. ; Zhumar, A.Yu.
Author_Institution
Inst. of Phys., Nat. Acad. of Sci. of Belarus, Minsk, Belarus
Volume
1
fYear
2005
fDate
12-17 Sept. 2005
Firstpage
298
Abstract
The appearance of elliptical polarization for reflected by plant leaves linear polarized radiation was investigated.. The leaf cuticle reflectance model was proposed. The evaluation of refractive index and mean angle of cuticle roughness to leaf surface was carried out.
Keywords
bio-optics; biological techniques; biomembranes; botany; measurement by laser beam; polarimetry; refractive index; surface roughness; elliptical polarization; laser polarimetry; leaf cuticle characteristics; leaf cuticle reflectance model; leaf cuticle surface roughness; linear polarized radiation; plant leaves; refractive index; Azimuth; Electromagnetic radiation; Laser beam cutting; Optical polarization; Polarimetry; Refractive index; Rough surfaces; Surface morphology; Surface roughness; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Optoelectronics and Lasers, 2005. Proceedings of CAOL 2005. Second International Conference on
Print_ISBN
0-7803-9130-6
Type
conf
DOI
10.1109/CAOL.2005.1553888
Filename
1553888
Link To Document