Title :
Genetic programming approach for fault modeling of electronic hardware
Author :
Abraham, Ajith ; Grosan, Crina
Author_Institution :
Sch. of Comput. Sci. & Eng., Chung-Ang Univ., Seoul, South Korea
Abstract :
This paper presents two variants of genetic programming (GP) approaches for intelligent online performance monitoring of electronic circuits and systems. Reliability modeling of electronic circuits can be best performed by the stressor - susceptibility interaction model. A circuit or a system is deemed to be failed once the stressor has exceeded the susceptibility limits. For on-line prediction, validated stressor vectors may be obtained by direct measurements or sensors, which after preprocessing and standardization are fed into the GP models. Empirical results are compared with artificial neural networks trained using backpropagation algorithm. The performance of the proposed method is evaluated by comparing the experiment results with the actual failure model values. The developed model reveals that GP could play an important role for future fault monitoring systems.
Keywords :
fault simulation; genetic algorithms; integrated circuit reliability; electronic circuits; electronic hardware; electronic systems; fault modeling; fault monitoring systems; genetic programming; intelligent online performance monitoring; reliability modeling; susceptibility interaction model; Artificial neural networks; Backpropagation algorithms; Circuit faults; Condition monitoring; Electronic circuits; Genetic programming; Hardware; Predictive models; Standardization; Stress measurement;
Conference_Titel :
Evolutionary Computation, 2005. The 2005 IEEE Congress on
Print_ISBN :
0-7803-9363-5
DOI :
10.1109/CEC.2005.1554875