Title :
An automatic device to measure the thermal diffusivity of thin film materials
Author :
Troitsky, Oleg Yu ; Medvedev, Valery V. ; Kim, Sok Won
Author_Institution :
Tomsk Polytech. Univ., Russia
fDate :
26 June-3 July 2004
Abstract :
A new automatic apparatus based on measuring the temperature evolution at the center of the pulsed annular laser beam when the laser beam irradiates the surface of a thin film material to obtain the thermal diffusivity has been developed. The serviceability of the device has been simulated with a computer. The results indicate the capability of the device to measure the thermal diffusivity.
Keywords :
laser beam applications; laser beam effects; temperature measurement; thermal diffusivity; thin films; laser beam irradiation; pulsed annular laser beam; serviceability; temperature evolution; thermal diffusivity; thin film materials; thin film surface; Computational modeling; Computer simulation; Laser beams; Optical materials; Optical pulses; Pulse measurements; Surface emitting lasers; Temperature measurement; Thin film devices; Transistors;
Conference_Titel :
Science and Technology, 2004. KORUS 2004. Proceedings. The 8th Russian-Korean International Symposium on
Print_ISBN :
0-7803-8383-4
DOI :
10.1109/KORUS.2004.1555621
