Title :
An automatic method to detect missing components in manufactured products
Author :
Acciani, G. ; Brunetti, G. ; Chiarantoni, E. ; Fornarelli, G.
Author_Institution :
Dipt. di Elettrotecnica ed Elettronica, Politecnico di Bari, Bari, Italy
fDate :
July 31 2005-Aug. 4 2005
Abstract :
In this paper we describe a method to recognize missing components on manufactured products. The proposed approach exploits the wavelet transform to extract features from the acquired data, while the diagnosis is performed by means of a neural network. The results show that this method achieves an high recognition rate. At the same time the method allows to use a very cheap diagnostic system.
Keywords :
feature extraction; manufactured products; neural nets; production engineering computing; wavelet transforms; feature extraction; manufactured products; missing components detection; neural network; wavelet transform; Circuit testing; Data mining; Electronic equipment testing; Feature extraction; Humans; Inspection; Manufactured products; Manufacturing industries; Neural networks; Production;
Conference_Titel :
Neural Networks, 2005. IJCNN '05. Proceedings. 2005 IEEE International Joint Conference on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-9048-2
DOI :
10.1109/IJCNN.2005.1556264
