DocumentCode :
446542
Title :
Low loss coplanar lines on low resistivity silicon SU-S thick negative photoresist
Author :
Marcelli, Romolo ; Catoni, S. ; Frenguelli, L.
Author_Institution :
Inst. for Microelectronics & Microsystems, CNR, Rome, Italy
Volume :
1
fYear :
2005
fDate :
3-5 Oct. 2005
Firstpage :
107
Abstract :
In this paper a new approach to obtain low losses coplanar waveguide (CPW) lines is described. A photolithographic process is performed by using SU-S thick negative photo-resist on low resistivity silicon to obtain CPW lines elevated with respect to the substrate to get the advantages from transmission line structures which are almost on-the-air.
Keywords :
coplanar waveguides; electrical resistivity; elemental semiconductors; photoresists; silicon; SU-S thick negative photoresist; Si; low loss coplanar lines; low resistivity silicon; photolithographic process; transmission line structures; Conductivity; Coplanar waveguides; EPON; Microelectronics; Optical materials; Passive optical networks; Postal services; Resists; Silicon; Tellurium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference, 2005. CAS 2005 Proceedings. 2005 International
Print_ISBN :
0-7803-9214-0
Type :
conf
DOI :
10.1109/SMICND.2005.1558722
Filename :
1558722
Link To Document :
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