• DocumentCode
    44722
  • Title

    Assessing the Lifetime Performance Index of Exponential Products With Step-Stress Accelerated Life-Testing Data

  • Author

    Hsiu-Mei Lee ; Jong-Wuu Wu ; Chia-Ling Lei

  • Author_Institution
    Dept. of Stat., Tamkang Univ., Taipei, Taiwan
  • Volume
    62
  • Issue
    1
  • fYear
    2013
  • fDate
    Mar-13
  • Firstpage
    296
  • Lastpage
    304
  • Abstract
    Lifetime performance assessment has been crucial to the manufacturing industry. In practice, a lifetime performance index CL is used to measure the larger-the-better type quality characteristics. Accelerated life test (ALT) has often been used to yield information quickly so that the life distribution of products can be estimated. This study constructs a maximum likelihood estimator (MLE) of CL for exponential products based on type II right censored data from the step-stress accelerated life test (SSALT). The MLE of CL is then utilized to develop the hypothesis testing procedure with the given lower specification limit L . This new testing procedure can be easily applied to assess whether the lifetime of products meets the requirements. Finally, we give two examples to explicate the proposed testing procedures.
  • Keywords
    manufacturing industries; maximum likelihood estimation; performance index; product quality; remaining life assessment; CL; MLE; SSALT; exponential product; larger-the-better type quality characteristics; lifetime performance index assessment; manufacturing industry; maximum likelihood estimator; product life distribution; product lifetime; step-stress accelerated life-testing data; type II right censored data; Exponential distribution; Indexes; Life estimation; Maximum likelihood estimation; Performance analysis; Stress; Testing; Hypothesis testing procedure; lifetime performance index; maximum likelihood estimator; step-stress accelerated life test; type II right censored data;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2013.2241197
  • Filename
    6450150