DocumentCode :
447765
Title :
Counterintuitive behavior of electron temperature in terahertz-driven heterojunctions
Author :
Cao, J.C.
Author_Institution :
Shanghai Inst. of Microsystem & Inf. Technol., Chinese Acad. of Sci., Shanghai, China
Volume :
1
fYear :
2005
fDate :
19-23 Sept. 2005
Firstpage :
146
Abstract :
We have studied electron transport and electron-hole pair generation-recombination rate in terahertz-driven InAs/AlSb heterojunctions (HJ). As many as needed multiphoton channels are self-consistently taken into account. Usually, II acts as a cooling mechanism of semiconductor. In the present THz-radiation-driven case with multiphoton process the electron temperature with II process, however, is higher than that without this process. We propose to explain the counterintuitive behavior of electron temperature.
Keywords :
III-V semiconductors; aluminium compounds; electron transport theory; electron-hole recombination; indium compounds; semiconductor heterojunctions; two-photon processes; InAs-AlSb; counterintuitive behavior; electron temperature; electron transport; electron-hole pair; generation-recombination rate; multiphoton channels; multiphoton process; semiconductor cooling mechanism; terahertz-driven heterojunctions; Cooling; Electrons; Electrooptic effects; Equations; Frequency; Heterojunctions; Impact ionization; Impurities; Scattering; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005. IRMMW-THz 2005. The Joint 30th International Conference on
Print_ISBN :
0-7803-9348-1
Type :
conf
DOI :
10.1109/ICIMW.2005.1572450
Filename :
1572450
Link To Document :
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