DocumentCode :
447877
Title :
Photoelectrochemical oxidation enhances optical output power in GaN-based light emitting diodes
Author :
Lin, Chia-Feng ; Yang, Zhong-Jie ; Zheng, Jing-Hui
Author_Institution :
Dept. of Mater. Eng., Nat. Chung-Hsing Univ., Taichung, Taiwan
Volume :
1
fYear :
2005
fDate :
22-27 May 2005
Firstpage :
156
Abstract :
Using the photoelectrochemical (PEC) oxidation process, the output power was increased by about 40%, caused by a reduced index reflectance from the GaN material to the outside air, and an increased roughness in the oxidized sidewalls. In addition, the enhanced output power was decreased when the PEC oxidation time was increased. These PEC treated InGaN/GaN MQW LEDs are suitable for all Nitride-based LED lighting applications.
Keywords :
III-V semiconductors; gallium compounds; indium compounds; light emitting diodes; light sources; oxidation; photoelectrochemistry; quantum well devices; GaN-based light emitting diode; InGaN-GaN; LED; index reflectance; optical output power; photoelectrochemical oxidation; Gallium nitride; Light emitting diodes; MOCVD; Mercury (metals); Oxidation; Power generation; Quantum well devices; Stimulated emission; Surface morphology; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2005. (CLEO). Conference on
Print_ISBN :
1-55752-795-4
Type :
conf
DOI :
10.1109/CLEO.2005.201709
Filename :
1572775
Link To Document :
بازگشت